MarSurf M 400 Easy. Fast. Innovative with Free Tracing and Automatic Zeroing.
For use as a small measuring station as well as for use as a mobile unit, the MarSurf M 400 fulfills the needs on the shopfloor and in production and the measuring room.
Skidless tracing with the skidless probe system BFW 250 and the drive unit SD 26 enable the measurement and evaluation of not only the roughness depth but also waviness and profile criteria. The magnetic probe arm holder allows different probe arms to be changed quickly and easily within seconds without the use of tools.
The motorized height adjustment enables automatic zero positioning and probe lifting. The Bluetooth function enables cable-free operation with this unit as well. Up to 250 measurements can be conducted with main-free operation due to the built-in battery.
Profile determination: Primary, waviness and roughness profile Tracing lengths Lt as per DIN EN ISO / JIS: 1.75 mm, 5.6 mm, 17.5 mm automatic, free entry (0.07 inc, 0.22 in, 0.7 in) as per MOTIF: 1 mm, 4 mm, 8 mm, 12 mm, 16 mmProbes: Inductive free-tracing system with exchangeable probe inserts, 2 μm probe tips, measuring force approx. 0.7 mN (standard) Standards DIN/ISO/JIS/ASME/MOTIF Total lengths lm (as per ISO/JIS) 1.25 mm, 4.0 mm, 12.5 mm Lots more: See Downloads tab for complete spec sheet
The MarSurf M 400 Set is delivered in a practical carrying case - consisting of:
- Evaluation unit M 400
- Drive unit MarSurf SD 26 incl. probe system BFW 250
- Standard probe arm (6852403)
- 1 thermo paper roll
- Wide-range power supply with 3 adapters
- 2 x USB cables (to connec to PCand for use with cable)
- Operation manual
Profile determination: Primary, waviness and roughness profile
Probes: Inductive skidless tracing system with exchangeable probe inserts, 2 μm probe arms, measuring force approx. 0.7 mN (standard). Standards DIN/ISO/JIS/ASME/MOTIF. Traversing lengths Lt as per DIN EN ISO / JIS: 1.75 mm, 5.6 mm, 17.5 mm automatic, free entry (0.07 inc, 0.22 in, 0.7 in) as per MOTIF: 1 mm, 2 mm, 4 mm, 8 mm, 12 mm, 16 mm
Evaluation lengths lm (as per ISO/JIS) 1.25 mm, 4.0 mm, 12.5 mm
Number n of sampling lengths (as per ISO/JIS): selectable
Automatic selection of filter and tracing length according to standards
Gaussian filter (as per DIN/JIS), Ls filter Standards DIN/ISO/JIS/ASME/MOTIF
Cutoff lc (as per ISO/JIS): 0.25 mm, 0.8 mm, 2.5 mm, automatic, (0.010 in, 0.032 in, 0.100 in)
Short cutoff (as per ISO/JIS) selectable
Measuring speed 0.2 mm/s; 1 mm/s
Profile resolution measuring range: ±250 μm = 8 nm, ±25 μm = 0.8 nm
15 languages, 3 of them Asian
Parameters as per: DIN/ISO: Ra, Rq, Rz, Rmax, Rp, Rv, Rpk, Rk, Rvk, Mr1, Mr2, A1, A2, Vo, Rt, R3z, RPc, Rmr (3x), HSC, RSm, Rsk, Rdc, Rdq, Rkn, Pa, Pt, Pmr (3x), Pdc, Wa, Wq, Wt, WSm, Wsk; JIS: Ra, Rz, RzJIS94, Sm, S; ASME: RpA, Rpm; MOTIF: R, Ar, Rx, W, Wx, Wte, CR, CL, CF, NR, NCRX, NW, CPM
Printing of R-profile (ISOASME//JIS), P-profile (MOTIF), material ratio curve, result record
Date and/or time of measurement
Integrated memory for results of up to approx. 40,000 measurements and 30 profiles
Dynamic calibration function
Lock/code number protection for unit settings