ZEISS SURFCOM NEX Surface-Contour Measurement Systems

Description

ZEISS SURFCOM NEX. One system, every possibility: surface, contour or both?
All SURFCOM NEX machines in the 001 to 141 series use the same base column. Only the sensors are different. By purchasing a sensor, you can turn your surface measuring instrument into a contour measuring system – or vice versa. Furthermore, additional sensors can be retrofitted, e.g. a hybrid sensor or a white light sensor.

Benefits
Future-proof modular system, can be upgraded on site
Considerably faster, less maintenance and fewer vibrations than standard system designs thanks to the patented non-contact linear drive in the X axis
Topography measurements up to seven times faster than systems with a spindle drive
Can be used with numerous sensors: surface, contour, hybrid or white light sensors
Topography function or lead twist measurement function can be quickly upgraded on site
Optional rotation tracing driver for standards-compliant effective surface measurement on rotationally symmetric features
Optional hand wheel to turn the tracing driver ±15 degrees
Can be upgraded through a combined CNC modular system: Y table, horizontal rotary table, vertical rotary table (see p. 32)
Various furniture solutions for SD versions and fully enclosed DX versions or compact FX versions with integrated active vibration damping and a minimal footprint