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ZEISS X-ray Tomographs Offer Complete Solutions

ZEISS X-ray Tomographs Offer Complete Solutions

The solutions in the ZEISS X-ray Series are used in the lab, measuring room and on the shop floor for research, product and process development and production. If a detailed, high-resolution analysis in the submicron or nano range is called far, ZEISS X-ray microscopes offer unbeatable flexibility: thanks to a unique, two-stage magnification optic and a high-resolution X-ray source, the user no longer has to choose between resolution and sample size.
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Introducing ZEISS ROTOS: A Whole New Dimension

Introducing ZEISS ROTOS: A Whole New Dimension


The latest sensor systems from ZEISS offer increased efficiency along with greater flexibility for the user. The new enhanced ZEISS ROTOS roughness sensor can be used on coordinate measuring machines to perform standard-compliant surface waviness and roughness inspections – even on complex workpieces, and all in a single measurement run without any reclamping.

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